<?xml version="1.0"?>
<dblp>
<article key="journals/todaes/PengHKW12" mdate="2012-02-08">
<author>Huan-Kai Peng</author>
<author>Hsuan-Ming Huang</author>
<author>Yu-Hsin Kuo</author>
<author>Charles H.-P. Wen</author>
<title>Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs.</title>
<pages>9</pages>
<year>2012</year>
<volume>17</volume>
<journal>ACM Trans. Design Autom. Electr. Syst.</journal>
<number>1</number>
<ee>http://doi.acm.org/10.1145/2071356.2071365</ee>
<url>db/journals/todaes/todaes17.html#PengHKW12</url>
</article>
</dblp>
