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@article{DBLP:journals/todaes/LeeTH99,
author = {Kuen-Jong Lee and
Jing-Jou Tang and
Tsung-Chu Huang},
title = {BIFEST: a built-in intermediate fault effect sensing and
test generation system for CMOS bridging faults},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {4},
number = {2},
year = {1999},
pages = {194-218},
ee = {http://doi.acm.org/10.1145/307988.307992},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2003-11-28 by Michael Ley (ley@uni-trier.de)