Test vector decomposition-based static compaction algorithms for combinational circuits.

Aiman H. El-Maleh Yahya E. Osais Test vector decomposition-based static compaction algorithms for combinational circuits. 430-459 2003 8 ACM Trans. Design Autom. Electr. Syst. 4 http://doi.acm.org/10.1145/944027.944030 db/journals/todaes/todaes8.html#El-MalehO03