BibTeX record journals/todaes/ChenCKYCH18

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@article{DBLP:journals/todaes/ChenCKYCH18,
  author       = {Tseng{-}Yi Chen and
                  Yuan{-}Hao Chang and
                  Yuan{-}Hung Kuan and
                  Ming{-}Chang Yang and
                  Yu{-}Ming Chang and
                  Pi{-}Cheng Hsiu},
  title        = {Enhancing Flash Memory Reliability by Jointly Considering Write-back
                  Pattern and Block Endurance},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {23},
  number       = {5},
  pages        = {64:1--64:24},
  year         = {2018},
  url          = {https://doi.org/10.1145/3229192},
  doi          = {10.1145/3229192},
  timestamp    = {Mon, 26 Jun 2023 20:58:25 +0200},
  biburl       = {https://dblp.org/rec/journals/todaes/ChenCKYCH18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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