<?xml version="1.0"?>
<dblp>
<article key="journals/tim/GiakosGSVSCNPMSPNEER01" mdate="2011-08-04">
<author>George C. Giakos</author>
<author>R. Guntupalli</author>
<author>N. Shah</author>
<author>Srinivasan Vedantham</author>
<author>Sankararaman Suryanarayanan</author>
<author>Samir Chowdhury</author>
<author>Richard Nemer</author>
<author>A. G. Passerini</author>
<author>K. Mehta</author>
<author>S. Sumrain</author>
<author>N. Patnekar</author>
<author>K. Nataraj</author>
<author>Edward A. Evans</author>
<author>R. E. Endorf</author>
<author>F. Russo</author>
<title>Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography.</title>
<pages>1604-1609</pages>
<year>2001</year>
<volume>50</volume>
<journal>IEEE T. Instrumentation and Measurement</journal>
<number>6</number>
<ee>http://dx.doi.org/10.1109/19.982953</ee>
<url>db/journals/tim/tim50.html#GiakosGSVSCNPMSPNEER01</url>
</article>
</dblp>
