<?xml version="1.0"?>
<dblp>
<article key="journals/tim/BoellaMMCG05" mdate="2011-05-26">
<author>Giorgio Boella</author>
<author>Iulian Mihai</author>
<author>Giancarlo Marullo-Reedtz</author>
<author>Pier Paolo Capra</author>
<author>Enrico Gasparotto</author>
<title>The IEN CCC bridge to scale the quantized Hall resistance to 1-&#937; standards.</title>
<pages>588-591</pages>
<year>2005</year>
<volume>54</volume>
<journal>IEEE T. Instrumentation and Measurement</journal>
<number>2</number>
<ee>http://dx.doi.org/10.1109/TIM.2004.843404</ee>
<url>db/journals/tim/tim54.html#BoellaMMCG05</url>
</article>
</dblp>
