@article{DBLP:journals/tim/AhnPPKP09,
author = {Sanghyun Ahn and
Zachary D. Patitz and
Noh-Jin Park and
Hyoung Joong Kim and
Nohpill Park},
title = {A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific
IC},
journal = {IEEE T. Instrumentation and Measurement},
volume = {58},
number = {5},
year = {2009},
pages = {1283-1290},
ee = {http://dx.doi.org/10.1109/TIM.2008.2009416},
bibsource = {DBLP, http://dblp.uni-trier.de}
}