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BibTeX record journals/tie/UgurXYPA21
@article{DBLP:journals/tie/UgurXYPA21, author = {Enes Ugur and Chi Xu and Fei Yang and Shi Pu and Bilal Akin}, title = {A New Complete Condition Monitoring Method for SiC Power MOSFETs}, journal = {{IEEE} Trans. Ind. Electron.}, volume = {68}, number = {2}, pages = {1654--1664}, year = {2021}, url = {https://doi.org/10.1109/TIE.2020.2970668}, doi = {10.1109/TIE.2020.2970668}, timestamp = {Thu, 17 Dec 2020 18:27:22 +0100}, biburl = {https://dblp.org/rec/journals/tie/UgurXYPA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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