BibTeX record journals/tie/ChenXWYN19

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@article{DBLP:journals/tie/ChenXWYN19,
  author       = {Hao Chen and
                  Shuai Xu and
                  Wenkai Wei and
                  Jian Yang and
                  Rui Nie},
  title        = {Reliability Assessment of Double-Sided Linear Switched Reluctance
                  Generator System Based on Hierarchical Markov Model},
  journal      = {{IEEE} Trans. Ind. Electron.},
  volume       = {66},
  number       = {6},
  pages        = {4901--4911},
  year         = {2019},
  url          = {https://doi.org/10.1109/TIE.2018.2851978},
  doi          = {10.1109/TIE.2018.2851978},
  timestamp    = {Mon, 28 Aug 2023 21:19:36 +0200},
  biburl       = {https://dblp.org/rec/journals/tie/ChenXWYN19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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