BibTeX record journals/tie/ChenXC21

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@article{DBLP:journals/tie/ChenXC21,
  author       = {Hao Chen and
                  Shuai Xu and
                  Sihang Cui},
  title        = {Reliability Evaluation for Power Converter of {SRM} on Fault-Tolerance
                  Capability and Thermal Stress},
  journal      = {{IEEE} Trans. Ind. Electron.},
  volume       = {68},
  number       = {2},
  pages        = {1749--1758},
  year         = {2021},
  url          = {https://doi.org/10.1109/TIE.2020.2977564},
  doi          = {10.1109/TIE.2020.2977564},
  timestamp    = {Thu, 17 Dec 2020 18:27:24 +0100},
  biburl       = {https://dblp.org/rec/journals/tie/ChenXC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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