BibTeX record journals/tie/BehjatiD13

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@article{DBLP:journals/tie/BehjatiD13,
  author       = {Hamid Behjati and
                  Ali Davoudi},
  title        = {Reliability Analysis Framework for Structural Redundancy in Power
                  Semiconductors},
  journal      = {{IEEE} Trans. Ind. Electron.},
  volume       = {60},
  number       = {10},
  pages        = {4376--4386},
  year         = {2013},
  url          = {https://doi.org/10.1109/TIE.2012.2216238},
  doi          = {10.1109/TIE.2012.2216238},
  timestamp    = {Sat, 09 Apr 2022 12:21:59 +0200},
  biburl       = {https://dblp.org/rec/journals/tie/BehjatiD13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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