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BibTeX record journals/tetc/BarenghiHBSRK14
@article{DBLP:journals/tetc/BarenghiHBSRK14, author = {Alessandro Barenghi and C{\'{e}}dric Hocquet and David Bol and Fran{\c{c}}ois{-}Xavier Standaert and Francesco Regazzoni and Israel Koren}, title = {A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks}, journal = {{IEEE} Trans. Emerg. Top. Comput.}, volume = {2}, number = {2}, pages = {107--118}, year = {2014}, url = {https://doi.org/10.1109/TETC.2014.2316509}, doi = {10.1109/TETC.2014.2316509}, timestamp = {Thu, 14 Oct 2021 09:41:22 +0200}, biburl = {https://dblp.org/rec/journals/tetc/BarenghiHBSRK14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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