BibTeX record journals/technometrics/WeaverM21

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@article{DBLP:journals/technometrics/WeaverM21,
  author       = {Brian P. Weaver and
                  William Q. Meeker},
  title        = {Bayesian Methods for Planning Accelerated Repeated Measures Degradation
                  Tests},
  journal      = {Technometrics},
  volume       = {63},
  number       = {1},
  pages        = {90--99},
  year         = {2021},
  url          = {https://doi.org/10.1080/00401706.2019.1695676},
  doi          = {10.1080/00401706.2019.1695676},
  timestamp    = {Tue, 02 Mar 2021 11:25:26 +0100},
  biburl       = {https://dblp.org/rec/journals/technometrics/WeaverM21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}