BibTeX record journals/technometrics/ThomasCXM23

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@article{DBLP:journals/technometrics/ThomasCXM23,
  author       = {Andrew M. Thomas and
                  Peter A. Crozier and
                  Yuchen Xu and
                  David S. Matteson},
  title        = {Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle
                  Images using Topological Data Analysis},
  journal      = {Technometrics},
  volume       = {65},
  number       = {4},
  pages        = {590--603},
  year         = {2023},
  url          = {https://doi.org/10.1080/00401706.2023.2203744},
  doi          = {10.1080/00401706.2023.2203744},
  timestamp    = {Tue, 28 Nov 2023 20:05:41 +0100},
  biburl       = {https://dblp.org/rec/journals/technometrics/ThomasCXM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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