BibTeX record journals/tdsc/RamanarayananDRKNXIU09

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@article{DBLP:journals/tdsc/RamanarayananDRKNXIU09,
  author       = {Rajaraman Ramanarayanan and
                  Vijay Degalahal and
                  Krishnan Ramakrishnan and
                  Jungsub Kim and
                  Vijaykrishnan Narayanan and
                  Yuan Xie and
                  Mary Jane Irwin and
                  Kenan Unlu},
  title        = {Modeling Soft Errors at the Device and Logic Levels for Combinational
                  Circuits},
  journal      = {{IEEE} Trans. Dependable Secur. Comput.},
  volume       = {6},
  number       = {3},
  pages        = {202--216},
  year         = {2009},
  url          = {https://doi.org/10.1109/TDSC.2007.70231},
  doi          = {10.1109/TDSC.2007.70231},
  timestamp    = {Thu, 09 Apr 2020 17:08:03 +0200},
  biburl       = {https://dblp.org/rec/journals/tdsc/RamanarayananDRKNXIU09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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