@article{DBLP:journals/tdsc/RamanarayananDRKNXIU09,
author = {Rajaraman Ramanarayanan and
Vijay Degalahal and
Krishnan Ramakrishnan and
Jungsub Kim and
Vijaykrishnan Narayanan and
Yuan Xie and
Mary Jane Irwin and
Kenan Unlu},
title = {Modeling Soft Errors at the Device and Logic Levels for
Combinational Circuits},
journal = {IEEE Trans. Dependable Sec. Comput.},
volume = {6},
number = {3},
year = {2009},
pages = {202-216},
ee = {http://doi.ieeecomputersociety.org/10.1109/TDSC.2007.70231},
bibsource = {DBLP, http://dblp.uni-trier.de}
}