BibTeX record journals/tdsc/LiTGWLL22

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@article{DBLP:journals/tdsc/LiTGWLL22,
  author       = {Qiang Li and
                  Dawei Tan and
                  Xin Ge and
                  Haining Wang and
                  Zhi Li and
                  Jiqiang Liu},
  title        = {Understanding Security Risks of Embedded Devices Through Fine-Grained
                  Firmware Fingerprinting},
  journal      = {{IEEE} Trans. Dependable Secur. Comput.},
  volume       = {19},
  number       = {6},
  pages        = {4099--4112},
  year         = {2022},
  url          = {https://doi.org/10.1109/TDSC.2021.3119970},
  doi          = {10.1109/TDSC.2021.3119970},
  timestamp    = {Tue, 18 Jun 2024 20:16:46 +0200},
  biburl       = {https://dblp.org/rec/journals/tdsc/LiTGWLL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}