Tanay Karnik Peter Hazucha Jagdish Patel Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes. 128-143 2004 1 IEEE Trans. Dependable Sec. Comput. 2 http://csdl.computer.org/comp/trans/tq/2004/02/q0128abs.htm db/journals/tdsc/tdsc1.html#KarnikHP04