![]() |
@article{DBLP:journals/tdsc/KarnikHP04,
author = {Tanay Karnik and
Peter Hazucha and
Jagdish Patel},
title = {Characterization of Soft Errors Caused by Single Event Upsets
in CMOS Processes},
journal = {IEEE Trans. Dependable Sec. Comput.},
volume = {1},
number = {2},
year = {2004},
pages = {128-143},
ee = {http://csdl.computer.org/comp/trans/tq/2004/02/q0128abs.htm},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2005-02-15 by Michael Ley (ley@uni-trier.de)