BibTeX record journals/tcasII/KhanYR23

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@article{DBLP:journals/tcasII/KhanYR23,
  author       = {Rafid Adnan Khan and
                  Saad Yousaf and
                  Gordon W. Roberts},
  title        = {An In-Circuit Test Method for Measuring the Bonding Resistances of
                  Individual {IC} Pins From an Interconnected Multiple {IC} Assembly
                  of Flexible Hybrid Electronics},
  journal      = {{IEEE} Trans. Circuits Syst. {II} Express Briefs},
  volume       = {70},
  number       = {3},
  pages        = {939--943},
  year         = {2023},
  url          = {https://doi.org/10.1109/TCSII.2022.3219462},
  doi          = {10.1109/TCSII.2022.3219462},
  timestamp    = {Tue, 28 Mar 2023 19:50:22 +0200},
  biburl       = {https://dblp.org/rec/journals/tcasII/KhanYR23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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