BibTeX record journals/tcasI/PaimZPCCBHA21

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@article{DBLP:journals/tcasI/PaimZPCCBHA21,
  author       = {Guilherme Paim and
                  Georgios Zervakis and
                  Girish Pahwa and
                  Yogesh Singh Chauhan and
                  Eduardo Antonio Cesar da Costa and
                  Sergio Bampi and
                  J{\"{o}}rg Henkel and
                  Hussam Amrouch},
  title        = {On the Resiliency of {NCFET} Circuits Against Voltage Over-Scaling},
  journal      = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
  volume       = {68},
  number       = {4},
  pages        = {1481--1492},
  year         = {2021},
  url          = {https://doi.org/10.1109/TCSI.2021.3058451},
  doi          = {10.1109/TCSI.2021.3058451},
  timestamp    = {Wed, 06 Apr 2022 17:32:41 +0200},
  biburl       = {https://dblp.org/rec/journals/tcasI/PaimZPCCBHA21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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