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BibTeX record journals/tcasI/PaimZPCCBHA21
@article{DBLP:journals/tcasI/PaimZPCCBHA21, author = {Guilherme Paim and Georgios Zervakis and Girish Pahwa and Yogesh Singh Chauhan and Eduardo Antonio Cesar da Costa and Sergio Bampi and J{\"{o}}rg Henkel and Hussam Amrouch}, title = {On the Resiliency of {NCFET} Circuits Against Voltage Over-Scaling}, journal = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.}, volume = {68}, number = {4}, pages = {1481--1492}, year = {2021}, url = {https://doi.org/10.1109/TCSI.2021.3058451}, doi = {10.1109/TCSI.2021.3058451}, timestamp = {Wed, 06 Apr 2022 17:32:41 +0200}, biburl = {https://dblp.org/rec/journals/tcasI/PaimZPCCBHA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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