@article{DBLP:journals/tcas/TangMR10,
author = {Tong Boon Tang and
Alan F. Murray and
Scott Roy},
title = {Methodology of Statistical RTS Noise Analysis With Charge-Carrier
Trapping Models},
journal = {IEEE Trans. on Circuits and Systems},
volume = {57-I},
number = {5},
year = {2010},
pages = {1062-1070},
ee = {http://dx.doi.org/10.1109/TCSI.2010.2043988},
bibsource = {DBLP, http://dblp.uni-trier.de}
}