@article{DBLP:journals/tcas/SongHYJP09,
author = {Jaehoon Song and
Juhee Han and
Hyunbean Yi and
Taejin Jung and
Sungju Park},
title = {Highly Compact Interconnect Test Patterns for Crosstalk
and Static Faults},
journal = {IEEE Trans. on Circuits and Systems},
volume = {56-II},
number = {1},
year = {2009},
pages = {56-60},
ee = {http://dx.doi.org/10.1109/TCSII.2008.2010168},
bibsource = {DBLP, http://dblp.uni-trier.de}
}