BibTeX record journals/tcas/SheikhHW16

download as .bib file

@article{DBLP:journals/tcas/SheikhHW16,
  author       = {Kaship Sheikh and
                  Shu{-}Jen Han and
                  Lan Wei},
  title        = {{CNFET} With Process Imperfection: Impact on Circuit-Level Yield and
                  Device Optimization},
  journal      = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
  volume       = {63-I},
  number       = {12},
  pages        = {2209--2221},
  year         = {2016},
  url          = {https://doi.org/10.1109/TCSI.2016.2617828},
  doi          = {10.1109/TCSI.2016.2617828},
  timestamp    = {Fri, 01 Oct 2021 17:31:47 +0200},
  biburl       = {https://dblp.org/rec/journals/tcas/SheikhHW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.