@article{DBLP:journals/tcas/PuZIMKTNSS11,
  author    = {Yu Pu and
               Xin Zhang and
               Katsuyuki Ikeuchi and
               Atsushi Muramatsu and
               Atsushi Kawasumi and
               Makoto Takamiya and
               Masahiro Nomura and
               Hirofumi Shinohara and
               Takayasu Sakurai},
  title     = {Post-Silicon Clock Deskew Employing Hot-Carrier Injection
               Trimming With On-Chip Skew Monitoring and Auto-Stressing
               Scheme for Sub/Near Threshold Digital Circuits},
  journal   = {IEEE Trans. on Circuits and Systems},
  volume    = {58-II},
  number    = {5},
  year      = {2011},
  pages     = {294-298},
  ee        = {http://dx.doi.org/10.1109/TCSII.2011.2149050},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}