The Design and Characterization of a Half-Volt 32 nm Dual-Read 6T SRAM.

Jente B. Kuang Jeremy D. Schaub Fadi H. Gebara Dieter F. Wendel Thomas Fröhnel Sudesh Saroop Sani R. Nassif Kevin J. Nowka The Design and Characterization of a Half-Volt 32 nm Dual-Read 6T SRAM. 2010-2016 2011 58-I IEEE Trans. on Circuits and Systems 9 http://dx.doi.org/10.1109/TCSI.2011.2162459 db/journals/tcas/tcasI58.html#KuangSGWFSNN11