BibTeX record journals/tcad/ZhuoSB13

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@article{DBLP:journals/tcad/ZhuoSB13,
  author       = {Cheng Zhuo and
                  Dennis Sylvester and
                  David T. Blaauw},
  title        = {A Statistical Framework for Post-Fabrication Oxide Breakdown Reliability
                  Prediction and Management},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {32},
  number       = {4},
  pages        = {630--643},
  year         = {2013},
  url          = {https://doi.org/10.1109/TCAD.2012.2228303},
  doi          = {10.1109/TCAD.2012.2228303},
  timestamp    = {Thu, 24 Sep 2020 11:26:53 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/ZhuoSB13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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