BibTeX record journals/tcad/YuRLW20

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@article{DBLP:journals/tcad/YuRLW20,
  author       = {Liting Yu and
                  Jianguo Ren and
                  Xian Lu and
                  Xiaoxiao Wang},
  title        = {{NBTI} and {HCI} Aging Prediction and Reliability Screening During
                  Production Test},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {39},
  number       = {10},
  pages        = {3000--3011},
  year         = {2020},
  url          = {https://doi.org/10.1109/TCAD.2019.2961329},
  doi          = {10.1109/TCAD.2019.2961329},
  timestamp    = {Mon, 26 Sep 2022 18:27:15 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/YuRLW20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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