BibTeX record journals/tcad/YiH06

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@article{DBLP:journals/tcad/YiH06,
  author       = {Joonhwan Yi and
                  John P. Hayes},
  title        = {High-level delay test generation for modular circuits},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {25},
  number       = {3},
  pages        = {576--590},
  year         = {2006},
  url          = {https://doi.org/10.1109/TCAD.2005.853697},
  doi          = {10.1109/TCAD.2005.853697},
  timestamp    = {Thu, 24 Sep 2020 11:28:52 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/YiH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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