BibTeX record journals/tcad/YaoYW14

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@article{DBLP:journals/tcad/YaoYW14,
  author       = {Jian Yao and
                  Zuochang Ye and
                  Yan Wang},
  title        = {Importance Boundary Sampling for {SRAM} Yield Analysis With Multiple
                  Failure Regions},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {33},
  number       = {3},
  pages        = {384--396},
  year         = {2014},
  url          = {https://doi.org/10.1109/TCAD.2013.2292504},
  doi          = {10.1109/TCAD.2013.2292504},
  timestamp    = {Thu, 24 Sep 2020 11:27:44 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/YaoYW14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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