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BibTeX record journals/tcad/YangWZCZCL16
@article{DBLP:journals/tcad/YangWZCZCL16, author = {Jianlei Yang and Peiyuan Wang and Yaojun Zhang and Yuanqing Cheng and Weisheng Zhao and Yiran Chen and Hai (Helen) Li}, title = {Radiation-Induced Soft Error Analysis of {STT-MRAM:} {A} Device to Circuit Approach}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {35}, number = {3}, pages = {380--393}, year = {2016}, url = {https://doi.org/10.1109/TCAD.2015.2474366}, doi = {10.1109/TCAD.2015.2474366}, timestamp = {Mon, 04 Jul 2022 14:19:31 +0200}, biburl = {https://dblp.org/rec/journals/tcad/YangWZCZCL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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