BibTeX record journals/tcad/SukharevKNYKCTZ22

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@article{DBLP:journals/tcad/SukharevKNYKCTZ22,
  author       = {Valeriy Sukharev and
                  Armen Kteyan and
                  Farid N. Najm and
                  Yong Hyeon Yi and
                  Chris H. Kim and
                  Jun{-}Ho Choy and
                  Sofya Torosyan and
                  Yu Zhu},
  title        = {Experimental Validation of a Novel Methodology for Electromigration
                  Assessment in On-Chip Power Grids},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {41},
  number       = {11},
  pages        = {4837--4850},
  year         = {2022},
  url          = {https://doi.org/10.1109/TCAD.2021.3134886},
  doi          = {10.1109/TCAD.2021.3134886},
  timestamp    = {Sun, 13 Nov 2022 17:52:49 +0100},
  biburl       = {https://dblp.org/rec/journals/tcad/SukharevKNYKCTZ22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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