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@article{DBLP:journals/tcad/StanionBS95,
author = {Ted Stanion and
Debashis Bhattacharya and
Carl Sechen},
title = {An efficient method for generating exhaustive test sets},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {14},
number = {12},
year = {1995},
pages = {1516-1525},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.476582},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-05-30 by Michael Ley (ley@uni-trier.de)