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@article{DBLP:journals/tcad/SrinivasJA96,
author = {Mandyam-Komar Srinivas and
James Jacob and
Vishwani D. Agrawal},
title = {Functional test generation for synchronous sequential circuits},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {15},
number = {7},
year = {1996},
pages = {831-843},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.503950},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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