Costas J. Spanos Stephen W. Director Parameter Extraction for Statistical IC Process Characterization. 66-78 1986 5 IEEE Trans. on CAD of Integrated Circuits and Systems 1 http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=28435&arnumber=1270178&count=21&index=6 db/journals/tcad/tcad5.html#SpanosD86