BibTeX record journals/tcad/SinghK93

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@article{DBLP:journals/tcad/SinghK93,
  author       = {Adit D. Singh and
                  C. Mani Krishna},
  title        = {On optimizing {VLSI} testing for product quality using die-yield prediction},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {12},
  number       = {5},
  pages        = {695--709},
  year         = {1993},
  url          = {https://doi.org/10.1109/43.277614},
  doi          = {10.1109/43.277614},
  timestamp    = {Sat, 10 Sep 2022 20:48:49 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/SinghK93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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