BibTeX record journals/tcad/SethA84

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@article{DBLP:journals/tcad/SethA84,
  author       = {Sharad C. Seth and
                  Vishwani D. Agrawal},
  title        = {Characterizing the {LSI} Yield Equation from Wafer Test Data},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {3},
  number       = {2},
  pages        = {123--126},
  year         = {1984},
  url          = {https://doi.org/10.1109/TCAD.1984.1270065},
  doi          = {10.1109/TCAD.1984.1270065},
  timestamp    = {Thu, 24 Sep 2020 11:26:41 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/SethA84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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