BibTeX record journals/tcad/SchutzSP82

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@article{DBLP:journals/tcad/SchutzSP82,
  author       = {A. Sch{\"{u}}tz and
                  Siegfried Selberherr and
                  Hans W. P{\"{o}}tzl},
  title        = {Analysis of Breakdown Phenomena in MOSFET's},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {1},
  number       = {2},
  pages        = {77--85},
  year         = {1982},
  url          = {https://doi.org/10.1109/TCAD.1982.1269997},
  doi          = {10.1109/TCAD.1982.1269997},
  timestamp    = {Thu, 24 Sep 2020 11:27:36 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/SchutzSP82.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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