Sarma Sastry Alice C. Parker Stochastic Models for Wireability Analysis of Gate Arrays. 52-65 1986 5 IEEE Trans. on CAD of Integrated Circuits and Systems 1 http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=28435&arnumber=1270177&count=21&index=5 db/journals/tcad/tcad5.html#SastryP86