BibTeX
@article{DBLP:journals/tcad/SarfertMST92,
author = {Thomas M. Sarfert and
Remo G. Markgraf and
Michael H. Schulz and
Erwin Trischler},
title = {A hierarchical test pattern generation system based on high-level
primitives},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {11},
number = {1},
year = {1992},
pages = {34-44},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.108617},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-06-19 by Michael Ley (ley@uni-trier.de)