<?xml version="1.0"?>
<dblp>
<article key="journals/tcad/SamiiSLCP08" mdate="2008-09-19">
<author>Soheil Samii</author>
<author>Mikko Selk&#228;l&#228;</author>
<author>Erik Larsson</author>
<author>Krishnendu Chakrabarty</author>
<author>Zebo Peng</author>
<title>Cycle-Accurate Test Power Modeling and Its Application to SoC Test Architecture Design and Scheduling.</title>
<pages>973-977</pages>
<year>2008</year>
<volume>27</volume>
<journal>IEEE Trans. on CAD of Integrated Circuits and Systems</journal>
<number>5</number>
<ee>http://dx.doi.org/10.1109/TCAD.2008.917974</ee>
<url>db/journals/tcad/tcad27.html#SamiiSLCP08</url>
</article>
</dblp>
