Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms.

Daniel G. Saab Youssef Saab Jacob A. Abraham Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms. 1278-1285 1996 15 IEEE Trans. on CAD of Integrated Circuits and Systems 10 http://doi.ieeecomputersociety.org/10.1109/43.541447 db/journals/tcad/tcad15.html#SaabSA96