<?xml version="1.0"?>
<dblp>
<article key="journals/tcad/RaoDBS06" mdate="2006-11-16">
<author>Rajeev R. Rao</author>
<author>Anirudh Devgan</author>
<author>David Blaauw</author>
<author>Dennis Sylvester</author>
<title>Analytical yield prediction considering leakage/performance correlation.</title>
<pages>1685-1695</pages>
<year>2006</year>
<volume>25</volume>
<journal>IEEE Trans. on CAD of Integrated Circuits and Systems</journal>
<number>9</number>
<ee>http://doi.ieeecomputersociety.org/10.1109/TCAD.2005.858351</ee>
<url>db/journals/tcad/tcad25.html#RaoDBS06</url>
</article>
</dblp>
