Dhiraj K. Pradhan Mitrajit Chatterjee GLFSR-a new test pattern generator for built-in-self-test. 238-247 1999 18 IEEE Trans. on CAD of Integrated Circuits and Systems 2 http://doi.ieeecomputersociety.org/10.1109/43.743744 db/journals/tcad/tcad18.html#PradhanC99