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@article{DBLP:journals/tcad/PomeranzR09,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {Functional Broadside Tests Under an Expanded Definition
of Functional Operation Conditions},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {28},
number = {1},
year = {2009},
pages = {121-129},
ee = {http://dx.doi.org/10.1109/TCAD.2008.2009152},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-03-23 by Michael Ley (ley@uni-trier.de)