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@article{DBLP:journals/tcad/Pilarski95,
author = {Slawomir Pilarski},
title = {Comments on "Test efficiency analysis of random self-test
of sequential circuits"},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {14},
number = {8},
year = {1995},
pages = {1044-1045},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.402504},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-05-30 by Michael Ley (ley@uni-trier.de)