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BibTeX record journals/tcad/PeachPWPHC20
@article{DBLP:journals/tcad/PeachPWPHC20, author = {Gregor Peach and Runyu Pan and Zhuoyi Wu and Gabriel Parmer and Christopher Haster and Ludmila Cherkasova}, title = {eWASM: Practical Software Fault Isolation for Reliable Embedded Devices}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {39}, number = {11}, pages = {3492--3505}, year = {2020}, url = {https://doi.org/10.1109/TCAD.2020.3012647}, doi = {10.1109/TCAD.2020.3012647}, timestamp = {Thu, 17 Dec 2020 18:29:37 +0100}, biburl = {https://dblp.org/rec/journals/tcad/PeachPWPHC20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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