BibTeX record journals/tcad/PatelHM04

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@article{DBLP:journals/tcad/PatelHM04,
  author       = {Ketan N. Patel and
                  John P. Hayes and
                  Igor L. Markov},
  title        = {Fault testing for reversible circuits},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {23},
  number       = {8},
  pages        = {1220--1230},
  year         = {2004},
  url          = {https://doi.org/10.1109/TCAD.2004.831576},
  doi          = {10.1109/TCAD.2004.831576},
  timestamp    = {Thu, 24 Sep 2020 11:28:08 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/PatelHM04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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