Makoto Nagata Jin Nagai Takashi Morie Atsushi Iwata Measurements and analyses of substrate noise waveform inmixed-signal IC environment. 671-678 2000 19 IEEE Trans. on CAD of Integrated Circuits and Systems 6 http://doi.ieeecomputersociety.org/10.1109/43.848088 db/journals/tcad/tcad19.html#NagataNMI00