Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias.

Saibal Mukhopadhyay Hamid Mahmoodi Kaushik Roy Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias. 174-183 2008 27 IEEE Trans. on CAD of Integrated Circuits and Systems 1 http://dx.doi.org/10.1109/TCAD.2007.906995 db/journals/tcad/tcad27.html#MukhopadhyayMR08