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@article{DBLP:journals/tcad/MukhopadhyayMR08,
author = {Saibal Mukhopadhyay and
Hamid Mahmoodi and
Kaushik Roy},
title = {Reduction of Parametric Failures in Sub-100-nm SRAM Array
Using Body Bias},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {27},
number = {1},
year = {2008},
pages = {174-183},
ee = {http://dx.doi.org/10.1109/TCAD.2007.906995},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-04-08 by Michael Ley (ley@uni-trier.de)